h3Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology /h3pEPFL - Swiss Federal Institute of Technology Lausanne /ppVilligen, Switzerland /ppThis position focuses on high-throughput imaging of static structural defects, while the companion position focuses on time-resolved imaging of dynamic processes. Each postdoc will lead their own independent research direction, with an opportunity for close collaborative work. /ph3Main duties and responsibilities /h3pYou will develop an acquisition and reconstruction framework that uses the known geometry, composition, and layout regularity of semiconductor devices as prior information to detect deeply buried defects from the smallest possible number of X-ray measurements. Our pipeline reconstructs each projection from thousands of diffraction patterns, followed by volume reconstruction from projections measured at many rotation angles. These are two inverse problems, each with its own sampling requirements. /pulliWhat is the minimum number of diffraction patterns and projections needed to identify a defect? /liliCan we detect defects from diffraction patterns alone, bypassing projection reconstruction? /liliCan we reliably identify defects without ever resolving them? /liliWhat is the best way to incorporate the known design information into the imaging process? /li /ulpThe primary focus will be on algorithm development, followed by their demonstration at synchrotron experiments. You will start working with real already existing experimental datasets and will have the opportunity to extend our established reconstruction pipeline, and integrate with new data acquisition methods. You will also get a chance to perform experiments at the cSAXS beamline of the upgraded Swiss Light Source synchrotron, as well as other facilities around the world. /ph3Profile /h3ulliPhD in physics, engineering, computer science, or a related field. /liliStrong scientific programming in Python and experience with GPU processing of large-scale datasets. /liliExperience with inverse problems and 3D reconstruction methods for tomography, laminography, or a closely related modality. /liliExcellent written and oral communication skills in English. /li /ululliCoherent diffractive imaging, especially ptychography. /liliSparse sensing, optimization, or Bayesian experimental design. /liliMachine learning for imaging. /liliSynchrotron experiment experience. /liliSemiconductor devices or metrology. /li /ul #J-18808-Ljbffr
Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology Arbeitgeber: 1000scholars
Das Max-Planck-Institut für Geoanthropologie in Jena bietet eine herausragende Arbeitsumgebung für PhD-Forscher, die sich mit quantitativen, historischen und archäologischen Stadtforschungen beschäftigen. Mit einem starken Fokus auf interdisziplinäre Zusammenarbeit, flexiblen Arbeitszeiten und umfangreichen Weiterbildungsmöglichkeiten fördert das Institut nicht nur die persönliche und berufliche Entwicklung seiner Mitarbeiter, sondern auch ein inklusives und familienfreundliches Arbeitsklima. Die Möglichkeit, an innovativen Forschungsprojekten zu arbeiten und Teil eines globalen Netzwerks von Wissenschaftlern zu sein, macht diese Position besonders attraktiv für engagierte Forscher.
