Postdoc: Data-Driven X-ray Nanoimaging for Chip Metrology

pEPFL seeks a Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology at Villigen, Switzerland. You will develop acquisition and reconstruction frameworks using known device geometry and design information to detect defects from the fewest X-ray measurements, with demonstrations at synchrotron facilities. /ppThe role focuses on algorithm development and processing thousands of diffraction patterns, leading independent research directions, and collaborating with /p #J-18808-Ljbffr