EPFL seeks a Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology at Villigen, Switzerland. You will develop acquisition and reconstruction frameworks using known device geometry and design information to detect defects from the fewest X-ray measurements, with demonstrations at synchrotron facilities.
The role focuses on algorithm development and processing thousands of diffraction patterns, leading independent research directions, and collaborating with
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Kontaktdaten:
EPFL - Swiss Federal Institute of Technology Lausanne Recruiting-Team
